Application: | Electronic Devices, Semiconductors |
---|---|
Conductive Layer: | Thick Copper Layer |
Material: | Al2O3 |
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Properties
|
Unit
|
Test Method
|
Material
|
|||
IN94
|
IN96
|
IN99
|
||||
Mechanical
|
Color
|
-
|
-
|
White
|
White
|
Ivory
|
Alumina Content
|
%
|
-
|
94
|
96
|
99
|
|
Bulk Density
|
g/cm3
|
ASTM C-20-83
|
3.70
|
3.80
|
3.90
|
|
Surface Roughness
|
Um
|
Profilometer
|
-
|
Max 0.6
|
-
|
|
Water Absorption
|
%
|
ASTM C373-72
|
0.0
|
0.0
|
0.0
|
|
Average Crystalline Size
|
Um
|
ASTM E112-88
|
4
|
3
|
4
|
|
Flexural Strength (20°C)
|
MPa
|
ASTM F417-78
|
350
|
370
|
370
|
|
Elastic Modulus
|
Gpa
|
ASTM C773-82
|
290
|
310
|
340
|
|
Poisson's Ratio
|
-
|
ASTM C773-82
|
0.22
|
0.22
|
0.22
|
|
Compressive Strength
|
Mpa
|
ASTM C773-82
|
2100
|
-
|
2500
|
|
Hardness
|
-
|
Knoop 1KG
|
12
|
-
|
14
|
|
Fracture Toughness
|
Mpa.m1/2
|
NOCHED BEAM
|
3.4
|
-
|
4.5
|
|
Thermal
|
Thermal Conductivity (20°C)
|
W/m.K
|
ASTM C408-82
|
21
|
24
|
28
|
Coefficient of Thermal Expansion(20~1000°C)
|
×10-6/°C
|
ASTM C372-81
|
8.0
|
7.8
|
8.1
|
|
Specific Heat
|
Cal/g°C
|
ASTM C351-82
|
0.2
|
0.2
|
0.2
|
|
Thermal Shock Resistance
|
°C
|
Customer
|
200
|
200
|
200
|
|
Max. Use Temperature
|
°C
|
-
|
1600
|
1600
|
1650
|
|
Electrical
|
Dielectric Strength
|
KV/mm
|
ASTM D116-76
|
≥12
|
≥15
|
≥17
|
Dielectric Constance (1MHz.25°C)
|
-
|
ASTM D150-81
|
9.2
|
9.6
|
9.7
|
|
Dielectric Loss (tan delta, 1MHz.25°C)
|
-
|
ASTM D150-81
|
0.0004
|
0.0003
|
0.0002
|
|
Volume Resistivity (25°C)
|
Ωcm2/cm
|
ASTM D1829-68
|
≥10 14
|
≥10 14
|
≥10 14
|